1.
Arsoba R, SuszyƄski Z. Application of Genetic Algorithm to Determine Thermal Properties of Microelectronic Layered Structures. SI [Internet]. 2008 Jun. 15 [cited 2024 Nov. 22];10(1):15-26. Available from: https://czasopisma.uph.edu.pl/studiainformatica/article/view/2828